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Title:
APPARATUS AND METHOD FOR HEAT TREATING
Document Type and Number:
Japanese Patent JPH05166743
Kind Code:
A
Abstract:

PURPOSE: To heat-treat a material without damage due to impurities from an elevation mechanism to the material to be treated by disposing the mechanism in the outer atmosphere, shutting OFF a material-to-be-treated holder from the atmosphere by an extensible bellowslike tube, and disposing it in the same atmosphere as that in a treating vessel.

CONSTITUTION: An elevation mechanism 4 is disposed in the outer atmosphere. A wafer holder 3 is shut OFF from the atmosphere by an extensible bellowslike tube 5, and disposed in the same atmosphere as that in a treating vessel. Damage of a semiconductor wafer 1 due to impurities from the mechanism 4 is prevented, and the wafer is smoothly heat-treated. The mechanism 4 is disposed in the atmosphere without sealing to reduce a volume of an entire apparatus. Thus, a material to be treated can be heat-treated without damage due to the impurities from the mechanism, a volume of a space to be evacuated is reduced to decrease in size an exhaust unit.


Inventors:
OKASE WATARU
Application Number:
JP35301091A
Publication Date:
July 02, 1993
Filing Date:
December 18, 1991
Export Citation:
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Assignee:
TEL SAGAMI LTD
International Classes:
H01L21/22; (IPC1-7): H01L21/22
Attorney, Agent or Firm:
Masahiko Oi



 
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