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Title:
APPARATUS AND METHOD FOR INSPECTING RF-ID MEDIA
Document Type and Number:
Japanese Patent JP3916580
Kind Code:
B
Abstract:

PROBLEM TO BE SOLVED: To provide an inspection apparatus capable of quickly and efficiently inspecting the RF-ID media sequentially carried in a prescribed direction by communication while avoiding wasteful communication inspection.
SOLUTION: The inspection apparatus includes: a carrying section (1) for sequentially carrying the RF-ID media (12) to inspect in a prescribed direction; discrimination sections (2:21, 22, 23) for discriminating the RF-ID media sequentially carried in the prescribed direction communicatable; and a communication inspection section (3) for applying communication inspection to the RF-ID media which the discrimination section discriminates communicatable. The discrimination section includes spectrum analyzers (22a, 22b) for measuring the resonance frequency of each of the RF-ID media.


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Inventors:
Okada, Takaaki
Ota, Yoriko
Application Number:
JP2003000078481
Publication Date:
February 16, 2007
Filing Date:
March 20, 2003
Export Citation:
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Assignee:
TOPPAN FORMS CO LTD
International Classes:
G06K13/077; G06K17/00; G01R31/26; H04B1/59; H04B17/00; G06K13/02; G06K17/00; G01R31/26; H04B1/59; H04B17/00; (IPC1-7): H04B17/00; G06K13/077; G06K17/00



 
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