Title:
APPARATUS AND METHOD FOR LENGTH MEASUREMENT BY CHARGED BEAM
Document Type and Number:
Japanese Patent JP2002062123
Kind Code:
A
Abstract:
To provide an apparatus and a method, for a length measurement by a charged beam, wherein the measurement error of a length measured result can be suppressed to a minimum.
In the charged-beam length measuring apparatus, a sample 3 in a prescribed scanning range is irradiated with a charged particle beam 4, and output data is formed on the basis of obtained scanning information. The same place of the sample 3 is measured in a plurality of numbers of times. When the error of at least one measured data from among a plurality of obtained measured data is large, the data whose error is large is deleted. When error data caused by a focus error or the like is deleted, the reliability of the apparatus can be enhanced.
Inventors:
ARIMOTO HIROSHI
TAJIMA MITSUGI
TAJIMA MITSUGI
Application Number:
JP2000251162A
Publication Date:
February 28, 2002
Filing Date:
August 22, 2000
Export Citation:
Assignee:
FUJITSU LTD
International Classes:
G01B15/00; (IPC1-7): G01B15/00
Attorney, Agent or Firm:
Kokubun Takaetsu
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