Title:
APPARATUS AND METHOD FOR MEASURING THREE-DIMENSIONAL SHAPE
Document Type and Number:
Japanese Patent JP2010276607
Kind Code:
A
Abstract:
To provide an apparatus and method for measuring a three-dimensional shape.
The apparatus for measuring the three-dimensional shape includes m projection sections that include a light source and a lattice element, transfers the lattice element n times, and projects lattice pattern illumination on a measuring object with each transfer, an image forming section for photographing a lattice pattern image reflected on the measuring object, and a control section for performing control so that the lattice element of at least one of the other projection sections is transferred while the lattice pattern image is photographed using on of the m projection sections. Thus, the measuring time of the three-dimensional shape is shortened.
Inventors:
KIN HIROSHI
KHO KWANG-ILL
YOU HEE-WOOK
SONG JAE MYEONG
KHO KWANG-ILL
YOU HEE-WOOK
SONG JAE MYEONG
Application Number:
JP2010120663A
Publication Date:
December 09, 2010
Filing Date:
May 26, 2010
Export Citation:
Assignee:
KOH YOUNG TECH INC
International Classes:
G01B11/00; G01B11/24
Domestic Patent References:
| JPH11211443A | 1999-08-06 | |||
| JP2006275529A | 2006-10-12 | |||
| JP2005214653A | 2005-08-11 | |||
| JP2005003409A | 2005-01-06 | |||
| JP2005337943A | 2005-12-08 | |||
| JP2004309240A | 2004-11-04 | |||
| JP2003279335A | 2003-10-02 |
Attorney, Agent or Firm:
Takahashi Hayashi & Partners
Previous Patent: INTERFERENCE TYPE OPTICAL FIBER GYROSCOPE WITH SILICON OPTICAL BENCH FRONT END
Next Patent: DENTAL COLOR ANALYSIS DEVICE
Next Patent: DENTAL COLOR ANALYSIS DEVICE