Title:
APPARATUS AND METHOD FOR MEASURING X-RAY DIFFRACTION
Document Type and Number:
Japanese Patent JPH07270345
Kind Code:
A
Abstract:
PURPOSE: To provide an X-ray diffraction-measuring apparatus which can catch a change of an X-ray diffraction pattern with a high time resolution by rapidly changing the temperature of a sample up and down and observe a change of crystal structure in detail.
CONSTITUTION: A high temperature furnace 26 is provided in a conventional apparatus constituted of an X-ray source 2 and a Zeemann-Bohlin camera 24. A film contained in a semi-cylindrical X-ray detector 28 is adapted to be automatically fed by an automatic film feed mechanism 30. Tree high temperature furnace 26 and the automatic film feed mechanism 30 are controlled by a high temperature furnace-controlling device 32.
Inventors:
FUJIMURA TORU
KATAYAMA MICHIO
KOBAYASHI YUJI
AKUTSU OSAMU
SUZUKI SAMON
KAWASAKI HIROSHI
SASAKI MASANARI
KATAYAMA MICHIO
KOBAYASHI YUJI
AKUTSU OSAMU
SUZUKI SAMON
KAWASAKI HIROSHI
SASAKI MASANARI
Application Number:
JP6335694A
Publication Date:
October 20, 1995
Filing Date:
March 31, 1994
Export Citation:
Assignee:
KAWASAKI STEEL CO
RIGAKU DENKI CO LTD
RIGAKU DENKI CO LTD
International Classes:
G01N23/207; G01N23/205; (IPC1-7): G01N23/207
Attorney, Agent or Firm:
Yoshio Kosugi (2 outside)
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