Title:
APPARATUS AND METHOD FOR NON-DESTRUCTIVE MEASUREMENT OF QUANTUM USING PARAMETRIC OSCILLATION
Document Type and Number:
Japanese Patent JPH01193660
Kind Code:
A
Abstract:
PURPOSE: To eliminate noise and to facilitate measurement by amplifying both first and second polarization states of an electromagnetic field parametrically and converting the polarization of the electromagnetic field and avoiding a back action. CONSTITUTION: A device 10 has a parametric amplifier 11 in an optical cavity 12 and a polarization converter 14 for giving Faraday rotation by an angle θto the polarization of an electromagnetic(EM) field. Also, signal beams included in the input EM field and meter beams are guided into the cavity 12 and a polarization surface is rotated by the converter 14, is amplified by an amplifier 11, is reflected by a reflection mirror 15, is passed through the converter 14 and is outputted. Then, one of two crossed polarization states is allowed to function for a signal and the other is allowed to function for meter, thus preventing noise from entering one right-angle constituent of the EM field (back action avoidance).
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Inventors:
HARII JIEFURII KIMUBURU
SHIRUBUANIA FUERUKUSHI PEREIRA
DANIERU FURANKU UOORUZU
SHIRUBUANIA FUERUKUSHI PEREIRA
DANIERU FURANKU UOORUZU
Application Number:
JP26034588A
Publication Date:
August 03, 1989
Filing Date:
October 15, 1988
Export Citation:
Assignee:
UNIV TEXAS
International Classes:
G01R33/032; G01J1/02; G01R29/08; (IPC1-7): G01J1/02; G01R29/08; G01R33/032
Attorney, Agent or Firm:
Minoru Nakamura (7 outside)