Title:
外観検査装置
Document Type and Number:
Japanese Patent JP7315282
Kind Code:
B2
Abstract:
Provided is an appearance inspection apparatus which, when a product has a defect, visually recognizes the status of its defect through an image. According to the present invention, the appearance inspection apparatus comprises: photographing cameras (12, 14, 17, 19) which photograph the appearance of a subject to be inspected (K); and a quality assessment apparatus (30) which determines judgment about certain assessment items based on the photographed image. The quality assessment apparatus (30) includes: a quality information memory unit (34) which relates the identification information of the subject to be inspected (K), when the subject to be inspected (K) is determined to be defective, and the assessment items for which the subject to be inspected (K) are determined to be defective for memorizing them; and an image memory unit (35) which memorizes by relating the identification information of the subject to be inspected (K) and the image data. The quality assessment apparatus (30) additionally includes: a quality information display unit (36) which displays statistical information on the quality of the subject to be inspected (K) which is inspected on a display unit (41); and an image display unit (37) which receives a selection signal for selecting an assessment item, and displays the image of the subject to be inspected (K) which is determined to be defective for the assessment item on the display unit (41).
Inventors:
Yoshinori Ban
Shinya Umetani
Yukiyo Kawano
Shinya Umetani
Yukiyo Kawano
Application Number:
JP2019123396A
Publication Date:
July 26, 2023
Filing Date:
July 02, 2019
Export Citation:
Assignee:
Daiichi Jitsu Biswill Co., Ltd.
International Classes:
G01N21/88; G01N21/85
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Attorney, Agent or Firm:
Satoshi Murakami