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Patent Searching and Data


Title:
ARITHMETIC UNIT AND TESTING APPARATUS
Document Type and Number:
Japanese Patent JP2007170891
Kind Code:
A
Abstract:

To provide a unit by calculating, the phase and amplitude of a response wave, when inputting sweep waves.

A sweep wave generator 1 produces sample data fsin on the sweep wave, sample data fcos of a waveform different from the sweep wave in phase by 90°, and data Δθ on an amount of change in phase at respective sampling times. The sweep wave fsin is impressed on a physical object 2, such as a specimen. Sample data fo on response waves, outputted from the physical object 2 and respective data outputted from the wave generator 1, are inputted into an arithmetic unit 3 to calculate the amplitude A and phase difference δ of the response wave fo, based on values Fs and Fc found, by integrating fo×fsin×Δθ and fo×fcos×Δθ by a period of a positive integral multiple of half a cycle. The use of this arithmetic circuit makes it possible to form a multishaft testing machine for driving a plurality of shafts, by the same sweep waves with its phase shifted without requiring special hardware.


Inventors:
Nakajima, Eiji
Application Number:
JP2005000366001
Publication Date:
July 05, 2007
Filing Date:
December 20, 2005
Export Citation:
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Assignee:
SAGINOMIYA SEISAKUSHO INC
International Classes:
G01N3/08; G01M7/02