Title:
Arrangement for optical measurement and related methods
Document Type and Number:
Japanese Patent JP6291418
Kind Code:
B2
Abstract:
An arrangement for optically measuring the surface of an optionally glossy target object, includes: a diffusive, semi-transparent illumination structure defining a hollow surface shape configured to surround the target object at least partially, the surface being further provided with at least two apertures, a number of light sources optically coupled to the diffusive illumination structure for illuminating the target object via the surface of the illumination structure, at least two imaging devices, each configured to image the target object via an aperture, and a control entity configured to instruct the number of light sources to form a sequence of predetermined illumination patterns illuminating the target object, to instruct the at least two imaging devices to obtain an image of the target object relative to each illumination pattern, and to derive, through the utilization of the patterns utilized and images obtained, a predetermined surface-related property of the target object.
Inventors:
Kelanen, Hemo
Letenen, Petri
Letenen, Petri
Application Number:
JP2014550675A
Publication Date:
March 14, 2018
Filing Date:
December 20, 2012
Export Citation:
Assignee:
Helmy Imaging Owai
International Classes:
G01B11/25; G01N21/84; G01N21/88
Domestic Patent References:
| JP6300702A | ||||
| JP5231837A |
Foreign References:
| WO2010118281A2 | ||||
| US6222630 |
Other References:
SANDERSON ARTHUR C,STRUCTURED HIGHLIGHT INSPECTION OF SPECULAR SURFACES,TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE,米国,IEEE,1998年 1月 1日,V10 N1,P44-55
Attorney, Agent or Firm:
Ryoichi Takaoka
Nao Oda
Kaoru Takahashi
Nao Oda
Kaoru Takahashi