Title:
アレイベースの試料特性評価
Document Type and Number:
Japanese Patent JP6517193
Kind Code:
B2
Abstract:
An optical sample characterization method is disclosed comprising: holding a sample in a sample container proximate at least one two-dimensional detector array assembly, wherein the sample container has a first end and a second end; setting up a gradient between the first end of the sample container and the second end of the sample container; illuminating the sample between the first end of the sample container and the second end of the sample container; and detecting light received from the illuminated sample from the first end of the sample container to the second end of the sample container by the two-dimensional an-ay assembly.
Inventors:
Louis E. Nail
Application Number:
JP2016517729A
Publication Date:
May 22, 2019
Filing Date:
June 06, 2014
Export Citation:
Assignee:
Malvern Instruments Limited
International Classes:
G01N21/17; G01N21/41; G01N21/47; G01N21/59
Domestic Patent References:
| JP9503064A | ||||
| JP62124440A | ||||
| JP2004532405A |
Foreign References:
| US4547071 | ||||
| US20070086918 | ||||
| US4360270 | ||||
| US20070155017 | ||||
| US5835211 |
Attorney, Agent or Firm:
Nagoya International Patent Service Corporation