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Title:
ASSEMBLING INSPECTION METHOD OF ELECTRONIC PARTS AND ELECTRONIC CIRCUIT BOARD AND ELECTRONIC APPLIANCE MANUFACTURED BY USING THE SAME METHOD
Document Type and Number:
Japanese Patent JP2003080364
Kind Code:
A
Abstract:

To provide an assembling inspection method using lead-free solder which compensates for the deterioration of assembling/inspecting ability due to material characteristic and an electronic circuit board and electronic appliance manufactured by using the assembling inspection method.

As shown in (a), when lead-free solder is used in the air, the solder does not spread owing to poor wettability and surface tension. In an inactive environment, however, the generation of oxidized film is extremely suppressed because of the decrease in oxygen. In addition, the effect of compensating for the deterioration of the wettability of the material is obtained because the oxidation does not proceed. As a result, as shown in (b), even when the solder containing no lead is used, the same result with the conventional soldering which contains lead excellent in wettability can be obtained. Therefore, the inspection device and the positioning precision of probe pin as in the conventional practice can be obtained and the inspection free from defective conductivity can be performed. Therein, 20 is an electronic parts, 21 is a land for checker, 22 is a copper foil part, 23 and 23' are lead free solder.


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Inventors:
NEGISHI TAKASHI
MUKAI KATSUHIKO
NAKAGAWA HIROMITSU
Application Number:
JP2001270597A
Publication Date:
March 18, 2003
Filing Date:
September 06, 2001
Export Citation:
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Assignee:
RICOH KK
International Classes:
G01R1/06; B23K1/00; H05K3/34; (IPC1-7): B23K1/00; H05K3/34
Domestic Patent References:
JPH03297190A1991-12-27
JP2000151095A2000-05-30
JPH10256722A1998-09-25
JPH0994691A1997-04-08
JPH05264588A1993-10-12
Attorney, Agent or Firm:
Masatoshi Isomura (1 outside)