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Patent Searching and Data


Title:
ATM CELL EXCHANGE INCORPORATING LOAD TEST FUNCTION
Document Type and Number:
Japanese Patent JPH0818570
Kind Code:
A
Abstract:

PURPOSE: To easily confirm the content of test data by generating a traffic along with the content of a load test from the ATM cell exchange being one component node in a system.

CONSTITUTION: A cell sent sequentially from a port #3 of an ATM cell exchange 70 of this tester is transferred via object ATM cell exchanges 71, 72 in the tested system and returns to the port #3 of the ATM cell exchange 70. Then the ATM cell exchanges 71-73 and terminal equipments 81-86 of the tested system are operated in a form close to the actual operation. Then load data are applied in addition from the tester use ATM cell exchange 70 to generate a traffic along with the content of the load test. Thus, the normality and the reply time, etc., of the operation of the tested system are confirmed. In this case, the load data generated from the tester use ATM cell exchange 70 are transferred through a set route and lost in the exchange 70, then no adverse effect is imposed on the tested system.


Inventors:
ENDO YOICHI
MATSUYAMA NOBUHITO
TANABE TOMOHIKO
Application Number:
JP15327694A
Publication Date:
January 19, 1996
Filing Date:
July 05, 1994
Export Citation:
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Assignee:
HITACHI LTD
HITACHI COMPUTER ELECTRONIC
International Classes:
H04Q3/00; H04L12/26; H04L12/28; H04L12/70; (IPC1-7): H04L12/28; H04L12/26; H04Q3/00
Attorney, Agent or Firm:
Ogawa Katsuo