Title:
大気圧イオン化質量分析装置
Document Type and Number:
Japanese Patent JP5601370
Kind Code:
B2
Abstract:
In a first-stage intermediate vacuum chamber (6), cluster ions causing a background noise are dominantly formed in area (A), while fragment ions are dominantly generated in area (B). Taking this fact into account, in an in-source CID analysis mode, a DC voltage higher than that applied to a skimmer (8) is applied to a first ion guide (7) so as to create an accelerating electric field in area (B), whereby the ions are sufficiently energized to promote the fragmentation. When the in-source CID is not performed, a DC voltage higher than that applied to the first ion guide (7) is applied to the exit end (3b) of a desolvation tube (3) so as to create an accelerating electric field only in area (A) without creating such a field in area (B), whereby both the formation of the cluster ions and the generation of the fragment ions are suppressed, so that a high-quality chromatogram can be obtained.
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Inventors:
向畑 Kazuo
Daisuke Okumura
Daisuke Okumura
Application Number:
JP2012521222A
Publication Date:
October 08, 2014
Filing Date:
June 24, 2010
Export Citation:
Assignee:
Shimadzu Corp.
International Classes:
H01J49/06; G01N27/62; H01J49/10
Domestic Patent References:
| JPH07507418A | 1995-08-10 | |||
| JP2000162189A | 2000-06-16 | |||
| JP2001101992A | 2001-04-13 | |||
| JP2004514263A | 2004-05-13 | |||
| JPH1012188A | 1998-01-16 | |||
| JP2009129868A | 2009-06-11 | |||
| JPH07159377A | 1995-06-23 | |||
| JPH07507418A | 1995-08-10 | |||
| JP2000162189A | 2000-06-16 | |||
| JP2001101992A | 2001-04-13 | |||
| JP2004514263A | 2004-05-13 |
Foreign References:
| WO2008157019A2 | 2008-12-24 |
Attorney, Agent or Firm:
Patent business corporation Kyoto international patent firm