To obtain an Auger analytical sample holder by which a grain boundary is analyzed quickly, simply and with good accuracy by installing an upper- part sample holder which fixes and holds one end of a sample, a lower-part sample holder which fixes and holds the other end of the sample, and the like.

A sample holder 2 is constituted of an upper-part sample holder 3 which fixes and holds one end of a sample 1, of a lower-part sample holder 4 which fixes and holds the other end of the sample 1 and of a shaft 6 which is used jointly by both sample holders 3, 4. When the sample 1 is fractured by the hammering operation of a hammer 8, the upper-part sample holder 3 is turned around the shaft 6. Then, fractured faces 9a, 9b (opposite fractures) of the sample 1 which is fixed to the sample holder 2 are exposed to the same side as the shaft 6 with reference to the bottom part 4b of the lower-part holder 4, and the fractured face 9a and the fractured face 9b are made parallel. As a result, the opposite fractures can be exposed simultaneously inside an Auger electron spectroscopic analyzer, and a grain boundary element can be analyzed quantitatively, quickly, simply and with excellent accuracy.