Title:
自己相関測定装置
Document Type and Number:
Japanese Patent JP6549448
Kind Code:
B2
Abstract:
An autocorrelation measurement device includes a first reflection member, a second reflection member, a focusing unit, a nonlinear optical crystal, a detection unit, a filter, an aperture, a delay adjusting unit, and an analysis unit. Incident pulsed light is transmitted through the second reflection member and incident on the first reflection member. First pulsed light reflected on a first reflection surface of the first reflection member and a second reflection surface of the second reflection member and second pulsed light reflected on a second reflection surface of the first reflection member and a first reflection surface of the second reflection member are incident on the nonlinear optical crystal via the focusing unit. Second harmonic light generated in the nonlinear optical crystal is detected by the detection unit.
Inventors:
Haruyasu Ito
Yasunori Igasaki
Okuma Souji
Yasunori Igasaki
Okuma Souji
Application Number:
JP2015166465A
Publication Date:
July 24, 2019
Filing Date:
August 26, 2015
Export Citation:
Assignee:
Hamamatsu Photonics Co., Ltd.
International Classes:
G01J11/00; G02F1/37
Domestic Patent References:
| JP2001074560A | ||||
| JP2009008419A | ||||
| JP2003106903A | ||||
| JP7270246A | ||||
| JP11326065A |
Foreign References:
| US20120044490 | ||||
| US3520616 | ||||
| US4480192 |
Other References:
長沼和則,超短パルス光の計測,光学,2001年,Vol.30 No.12,pp.834-844
Attorney, Agent or Firm:
Yoshiki Hasegawa
Yoshiki Kuroki
Kenichi Shibayama
Masatoshi Shibata
Yoshiki Kuroki
Kenichi Shibayama
Masatoshi Shibata