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Title:
AUTOMATIC ALIGNMENT DEVICE FOR OBJECT OF MEASUREMENT BY INTERFERENCE MEASUREMENT SYSTEM
Document Type and Number:
Japanese Patent JPS61247904
Kind Code:
A
Abstract:

PURPOSE: To align an object of measurement easily, accurately, and speedily by placing the alignment area of the object of measurement and the photodetection surface of a peak value detecting means approximately in image formation relation.

CONSTITUTION: An alignment unit 20 constitutes an alignment means and a beam splitter 16 and a condenser lens 22 constitute a position detecting and separating means. Further, a CDC sensor 24 and a peak detecting circuit 26 constitute the peak value detecting means and an I/O port 42, an interface 44, a microcomputer 46, and a keyboard 48 constitute a control means. Even when the object 100 of measurement is fitted at a wring position or greatly eccentric, the alignment area and the photodetection surface of the peak value detecting means are approximately in image formation relation, so the peak position of position detection light is in the photodetection surface of the CCD sensor 24 at any time.


Inventors:
KITABAYASHI JUNICHI
Application Number:
JP9050585A
Publication Date:
November 05, 1986
Filing Date:
April 26, 1985
Export Citation:
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Assignee:
RICOH KK
International Classes:
G01M11/00; G01B9/02; G01B11/00; G01B11/27; G03F9/00; (IPC1-7): G01B11/00; G01M11/00; G03F9/00
Attorney, Agent or Firm:
Toru Kabayama