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Title:
AUTOMATIC ANALYSIS DEVICE
Document Type and Number:
Japanese Patent JP2017044507
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide an automatic analysis device with which it is possible to prevent the occurrence of an analysis error due to memory leakage without stopping the operation of an analysis device and maintain long-time continuous operation.SOLUTION: Provided is an automatic analysis device comprising an analysis unit equipped with an analysis mechanism for executing analysis, a control unit of the analysis unit for controlling the execution of maintenance of the analysis mechanism, and an operation unit for indicating the execution of analysis and the execution of maintenance to the control unit, wherein the automatic analysis device reactivates the operation unit when the operation unit has indicated the execution of maintenance to the control unit.SELECTED DRAWING: Figure 3

Inventors:
KUBOTA MIZUE
NODA TAKAYUKI
Application Number:
JP2015165351A
Publication Date:
March 02, 2017
Filing Date:
August 25, 2015
Export Citation:
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Assignee:
HITACHI HIGH TECH CORP
International Classes:
G01N35/00
Domestic Patent References:
JP2002162400A2002-06-07
JP2007010357A2007-01-18
JP2015129659A2015-07-16
JPH06160397A1994-06-07
JPS6488252A1989-04-03
JP2005274470A2005-10-06
Foreign References:
US20150104796A12015-04-16
Attorney, Agent or Firm:
Manabu Inoue
Yuji Toda
Shigemi Iwasaki



 
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