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Patent Searching and Data


Title:
AUTOMATIC DEVICE FOR CALIBRATION
Document Type and Number:
Japanese Patent JPS6337213
Kind Code:
A
Abstract:
PURPOSE:To secure the accuracy of analysis by a method wherein an estimated rate of variation at a subsequent calibration after an equal-interval period is computed from the rate of change of an amount of variation in every calibration period, so as to make the calibration period proper and, in particular, to define the criterion for judgement in the case when this period is prolonged. CONSTITUTION:An output in a gas analyzer 1 is compared, in a reference comparator 3, with the output of a reference value setting unit 4. A difference between these outputs is detected as an amount of variation by a variation amount detector 5, and based on a detection signal thereof, the output of the analyzer 1 is corrected by a correction output unit 6. Meanwhile, each amount of variation between the preceding calibration periods is stored in a variation amount memory 7 and the amount of variation in the current calibration in a memory 8. Next, an estimated amount D0 of variation at the next calibration is computed on the basis of these amounts of variation by a first arithmetic unit 9, and the result is compared with a set amount alpha of tolerance by a first comparator 10. When the result is less than the amount alpha of tolerance, an estimated amount D00 of variation at a calibration after the next time is computed on the basis of the amount D0 of variation by a second arithmetic unit 11, and the result is compared with a set amount beta of tolerance by a second comparator 12. When the result is less than the amount beta of tolerance, the calibration period is set to be twice as long by a judging unit 13.

Inventors:
MIKI HIDEYUKI
Application Number:
JP18167586A
Publication Date:
February 17, 1988
Filing Date:
July 31, 1986
Export Citation:
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Assignee:
SHIMADZU CORP
International Classes:
G01N35/00; G01D3/028; G05B21/02; (IPC1-7): G01D3/04; G01N35/00; G05B21/02
Attorney, Agent or Firm:
Shintaro Nogawa