To provide an automatic display system for quality assurance to a user's liking enabling the user of a semiconductor device or the like to know simply the accurate quality assurance degree on its quality and to use it without anxiety.

Inspection item graded data generated by deciding and grading reliability of each inspection item of an inspection object 10 are held in an inspection item data holding part 2a of a data processing device 2, and the inspection item graded data in the inspection item data holding part 2a are transferred to a data processing part 2b of the data processing device 2. Then, overall graded data on the quality assurance degree of the inspection object 10 are determined based on algorithm of the data processing part 2b, and the overall graded data by the data processing part 2b are transferred to a display device 3, and the overall graded data are displayed on the display device 3.