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Patent Searching and Data


Title:
AUTOMATIC FLAW DETECTOR
Document Type and Number:
Japanese Patent JP61062858
Kind Code:
A
Abstract:

PURPOSE: To achieve a smaller size of a flaw detector, by a method wherein a rotary orbit is provided on a stationary orbit on the circumference of a cylindrical object, a flaw detection body moving unit mounted thereon and a driving source set outside the rotary orbit for the rotary orbit and a probe moving mechanism.

CONSTITUTION: A stationary orbit 8 is mounted on the circumference of a cylindrical object 1 to be inspected like a piping. A rotary orbit 9 turns on the stationary orbit. A probe moving screw 10 mounted on a flaw detection body moving unit 11 moves a probe coaxially with respect to the cylindrical object 11. The flaw detection body moving unit 11 rotates circumferentially with respect to the cylindrical object 1 together with the rotary orbit 9 driven by a driving source 12. The distance of the unit 11 moved in the circumferencewise direction of the cylindrical object 1 is indexed with deceleration/indexing mechanism 15 by the rotation of a pinion 14 following the unit 11. The unit 11 moves at a fixed distance in the circumferencewise direction of the cylindrical object I and a probe moving screw 10 is turned to move the probe at a fixed distance axially with respect to the cylindrical object 1.


Inventors:
Kimura, Yutaka
Akasu, Akira
Asano, Kunitaka
Application Number:
JP1984000186160
Publication Date:
March 31, 1986
Filing Date:
September 04, 1984
Export Citation:
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Assignee:
HITACHI LTD
HITACHI ENG CO LTD
International Classes:
G01N29/04; B23Q9/00; G01N29/265; G01N29/04; B23Q9/00; G01N29/26; (IPC1-7): G01N29/04