Title:
AUTOMATIC INSPECTING DEVICE OF ELECTRONIC COMPONENT
Document Type and Number:
Japanese Patent JP2607423
Kind Code:
B
Abstract:
PURPOSE: To eliminate the jamming problem of electronic components so as to shorten the inspecting time of an automatic inspecting device of electronic components and, at the same time, to improve the reliability of the device by individually and separately carrying and supplying the electronic components.
CONSTITUTION: An idle chute 15 receives electronic components 2 form a pool chute 6 at a first device delivering/receiving position. A device delivering/ receiving member 17 returns to a second delivering/receiving position from the first delivering/receiving position to deliver the electronic components 2 in the chute 15 to a measurement chute 16 and returns to the first position after delivery. When the member 17 descends and moves to the second position, the idle chute 15 receives electronic components 2 from the pool chute 6 and temporarily retreats to a waiting position. Upon receiving the components 2, the measurement chute 16 moves to a measuring position and, when characteristic measurement is completed, returns to the second position and drops the inspected components 2 onto a discharge chute 10.
Inventors:
Morii, Atsushi
Application Number:
JP1993000317542
Publication Date:
February 13, 1997
Filing Date:
November 25, 1993
Export Citation:
Assignee:
TESETSUKU:KK
International Classes:
G01R31/26; B65G47/08; B65G47/78; H01L21/66; H05K13/08; G01R31/26; B65G47/04; B65G47/78; H01L21/66; H05K13/00; (IPC1-7): G01R31/26; B65G47/08; B65G47/78; H01L21/66; H05K13/08
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