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Patent Searching and Data


Title:
AUTOMATIC INSPECTION SYSTEM OF IC LEAD FRAME AND ITS OPERATION
Document Type and Number:
Japanese Patent JPH11186487
Kind Code:
A
Abstract:

To provide an automatic and high-speed form inspection of an IC lead frame, by providing a CCD camera and a lightning control part, receiving and checking an image, and deciding a good or bad item of the lead frame.

An image processing part 200 is logically composed of twelve frames and can store maximum of twelve images. When a lead frame 700 is transferred by a transfer device 600 and a sensor 601 perceives this, a sensor signal is inputted to the image processing part 200 through a signal input and output part 300. And a lighting control part 500 is driven when a main control computer part 100 acknowledges the sensor signal, a CCD camera 400 is driven, and the image is inputted to a memory of the main control computer part 100 though the image processing part 200, thus the lead frame 700 is classified as normal or abnormal according to the result of the inspection. Therefore, a form inspection of a lead frame which has formerly conducted visually by inspectors is improved as processable at high speed and automatically.


Inventors:
O UON KUN
KIM HYON JIN
RI IN HO
WI MYON CHIN
RI ZON TEKU
HON SOKU DON
Application Number:
JP5610298A
Publication Date:
July 09, 1999
Filing Date:
February 20, 1998
Export Citation:
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Assignee:
KOREA ELECTRONICS TELECOMM
POONGSAN SEIMITSU KK
International Classes:
H01L23/50; H01L21/66; (IPC1-7): H01L23/50
Attorney, Agent or Firm:
Eiichi Saito