Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
Automatic pollution detection of a capacitance diaphragm gauge
Document Type and Number:
Japanese Patent JP6125049
Kind Code:
B2
Abstract:
A system and a method detect contamination of a diaphragm in a capacitance diaphragm gauge wherein a contaminated diaphragm deflects less in the presence of pressure than an uncontaminated diaphragm. The system and method measure a base pressure. A DC voltage is applied between the diaphragm and a fixed electrode to cause the diaphragm to deflect to simulate an effective pressure. The system and method measure a combined pressure caused by the base pressure and the effective pressure. The system and method subtract the base pressure to determine the effective pressure caused by the static diaphragm deflection. If the measured effective pressure is less than an acceptable effective pressure, the system and method determine that the diaphragm is contaminated.

More Like This:
WO/2001/018518DETERMINATION AND MONITORING OF THE PRESSURE TRANSMISSION BEHAVIOUR OF A SYSTEM (CATHETER) WITH AN ADDITIONAL IMPEDANCE, SAID SYSTEM BEING FILLED WITH A LIQUID
JP3917574ULTRA-PRECISE MINUTE DIFFERENTIAL PRESSURE MEASURING DEVICE AND ULTRA-PRECISE DIFFERENTIAL PRESSURE MEASURING DEVICE
Inventors:
Ferran David Jay.
Ferran Robert Jay.
Application Number:
JP2015555406A
Publication Date:
May 10, 2017
Filing Date:
January 28, 2014
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
FERRAN TECHNOLOGY,INC.
International Classes:
G01L27/00; G01L9/12
Domestic Patent References:
JP2009524823A
JP2001141592A
JP510968A
Foreign References:
US4823603
Attorney, Agent or Firm:
Fumio Takino
Hideo Takino
Takao Kawasaki
Toshiaki Tsuda
Masashi Torino



 
Previous Patent: A nuclear power plant provided with the intake equipment and such equipment for cooling a nuclear po...

Next Patent: JPS6125050