Title:
AUTOMATIC POSITION DETERMINATION FOR DEVICE BEING TESTED
Document Type and Number:
Japanese Patent JP2000088905
Kind Code:
A
Abstract:
To enable precisely pointing out a physical position of a device under each test to trace so that correction can be made in the case of being unacceptable to an test in a burn-rack test device and surely shipping to an exact customer in the case of being acceptable.
The device is provided with a burn-rack 10 including a plurality of work cells 12, a network management protocol switch device 18 with simple construction that is adjacent to the burn-rack 10 and provided with a plurality of ports P, a plurality of cables respectively connecting each port P of the switch device 18 and each work cell 12, and a monitor R that is placed with being adjacent to the burn-rack 10 and connected to a port of the switch device 18.
Inventors:
SABUHASHINI RAJAN
ROGER WONG
ROGER WONG
Application Number:
JP16769199A
Publication Date:
March 31, 2000
Filing Date:
June 15, 1999
Export Citation:
Assignee:
DELL USA LP
International Classes:
G06F11/24; G01R31/00; G01R31/26; G06F11/22; G06F11/273; (IPC1-7): G01R31/00; G01R31/26; G06F11/24
Attorney, Agent or Firm:
Takehiko Suzue (4 outside)