Title:
AUTOMATIC TEST EQUIPMENT
Document Type and Number:
Japanese Patent JPS5418643
Kind Code:
A
Abstract:
PURPOSE: To reduce the quantity of the test program and thus to simplify the production work, by providing a temporary memory unit into the circuit which connects the input side of the under-test unit and the test program.
Inventors:
KUWABARA TAKEO
IWAKI JIHACHI
IWAKI JIHACHI
Application Number:
JP8300077A
Publication Date:
February 10, 1979
Filing Date:
July 13, 1977
Export Citation:
Assignee:
HITACHI LTD
KASHIO DENKI KK
KASHIO DENKI KK
International Classes:
G01R31/3183; G05B19/00; G05B19/02; G01R31/28; G06F11/00; G06F11/22; (IPC1-7): G01R31/28; G05B19/00; G06F11/00