Title:
バンク補修方法、有機ＥＬ表示装置の製造方法および有機ＥＬ表示装置
Document Type and Number:
Japanese Patent JP6649714
Kind Code:
B2
Abstract:
A bank repair method in a manufacturing process of an organic EL display device including first and second banks forming a matrix over a substrate. When a defect portion of a first bank is detected, in each of adjacent concave spaces between which the first bank having the defect portion is located, a candidate forming position is set and a dam portion partitioning the concave space into a first space in a vicinity of the defect portion and a second space outside the vicinity of the defect portion is formed. When denoting sub-pixel region surface area as H and denoting a surface area of a region of a candidate first space overlapping with a sub-pixel region as I, the dam portion is formed at the candidate forming position according to a first forming method when I<α×H is fulfilled, where 0.05<α<0.9.
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Inventors:
Toshiaki Onimaru
Application Number:
JP2015153871A
Publication Date:
February 19, 2020
Filing Date:
August 04, 2015
Export Citation:
Assignee:
Joled Co., Ltd.
International Classes:
H05B33/10; G09F9/30; H01L27/32; H01L51/50; H05B33/12; H05B33/22
Domestic Patent References:
| JP6311794B2 | ||||
| JP2008076725A |
Foreign References:
| WO2015118882A1 | ||||
| WO2015118883A1 | ||||
| WO2010013654A1 |
Attorney, Agent or Firm:
Patent business corporation Nakajima intellectual property integrated office