Title:
BIMETAL TEST SWITCH
Document Type and Number:
Japanese Patent JP2004061517
Kind Code:
A
Abstract:
To provide an inexpensive temporary switch incorporated in a device of battery driving started up for a test of the device by a consumer during a packed condition of the device.
A folded bimetal test strip is inserted between the battery inside a flashlight having a non-zero quiescent current and an electric circuit. The consumer is able to test the flashlight temporarily by pushing the test strip in. The strip is removed thereafter by the consumer after the flashlight has been purchased.
Inventors:
ALLEN DAVID M
Application Number:
JP2003281378A
Publication Date:
February 26, 2004
Filing Date:
July 28, 2003
Export Citation:
Assignee:
ALLEN DAVID M
International Classes:
G01R31/36; F21V23/04; G01N27/416; G01R31/00; G01R31/44; H01H13/70; H01H27/04; H01M6/50; H01M10/48; H01H; (IPC1-7): G01R31/00; G01R31/36; H01H27/04
Attorney, Agent or Firm:
Hidesaku Yamamoto
Takaaki Yasumura
Natsuki Morishita
Takaaki Yasumura
Natsuki Morishita