Title:
複屈折特性測定方法および装置
Document Type and Number:
Japanese Patent JP4629869
Kind Code:
B2
Abstract:
A practical system and method for precisely measuring low-level birefrigence properties (retardance and fast axis orientation) of optical materials (26). The system permits multiple measurements to be taken across the area of a sample to detect and graphically display (100) variations in the birefrigence properties across the sample area. In a preferred embodiment, the system incorporates a photoelastic modulator (24) for modulating polarized light that is then directed through a sample (26). The beam ("Bi") propagating from the sample is separated into two parts, with one part ("B1") having a polarization direction different than the polarization direction of the other beam part ("B2"). These separate beam parts are then processed as distinct channels. Detection mechanisms (32, 50) associated with each channel detect the time varying light intensity corresponding to each of the two parts of the beam. The information is combined for calculating a precise measure of the retardance induced by the sample, as well as the sample's fast axis orientation.
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Inventors:
One, Baolyan
Oakburg, Theodore Sea
Cadrec, Paul
Oakburg, Theodore Sea
Cadrec, Paul
Application Number:
JP2000532690A
Publication Date:
February 09, 2011
Filing Date:
February 17, 1999
Export Citation:
Assignee:
Hines Instruments, Inc.
International Classes:
G01J4/04; G01B9/02; G01N21/23
Domestic Patent References:
| JP5249031A | ||||
| JP1182737A | ||||
| JP54164173A |
Other References:
持田悦宏,“位相変調法による複屈折 測定と応用”,光技術コンタクト,1989年,Vol.27, No.3,pp.127-134
B.Wang,“An improved method for measuring low-level linear birefringence in optical materials”,Proceedings SPIE,1998年 7月,Vol.3424,pp.120-124
B.Wang,“An improved method for measuring low-level linear birefringence in optical materials”,Proceedings SPIE,1998年 7月,Vol.3424,pp.120-124
Attorney, Agent or Firm:
Nobuyuki Matsunaga