Title:
BOUNCE TEST DEVICE
Document Type and Number:
Japanese Patent JP2020112532
Kind Code:
A
Abstract:
To provide a bounce test device capable of finely adjusting impact force.SOLUTION: A platform 100 has a surface 110 that supports a test object. A support assembly 200 is disposed below the platform 100 so as to reciprocate the platform 100 along a vertical direction D and includes a reciprocating structure 210 and a pressure regulating component 220. The reciprocating structure 210 is configured to move the platform 100 between a first position and a second position. The pressure regulating component 220 is disposed adjacent to the reciprocating structure 210 and applies positive or negative pressure (vacuum) to the platform 100 by indirect contact means via a cylinder or an air bag.SELECTED DRAWING: Figure 2
Inventors:
LEE YUN-CHENG
Application Number:
JP2019026761A
Publication Date:
July 27, 2020
Filing Date:
February 18, 2019
Export Citation:
Assignee:
LEE YUN CHENG
International Classes:
G01M7/08; F16H53/02
Domestic Patent References:
| JPS5960535U | 1984-04-20 | |||
| JPH1194691A | 1999-04-09 | |||
| JP2002096309A | 2002-04-02 | |||
| JP2008281544A | 2008-11-20 | |||
| JPS61293582A | 1986-12-24 | |||
| JP2012083133A | 2012-04-26 |
Foreign References:
| CN204241184U | 2015-04-01 | |||
| CN102004023A | 2011-04-06 | |||
| CN103706552A | 2014-04-09 |
Attorney, Agent or Firm:
Kimura Mitsuru
Taiji Morikawa
Kei Sakurada
Mie Hideki
Taiji Morikawa
Kei Sakurada
Mie Hideki