Title:
BURIED STRUCTURE INVESTIGATION DEVICE AND INVESTIGATION IMAGE DISPLAY CONTROL METHOD, AND INVESTIGATION IMAGE DISPLAY CONTROL PROGRAM
Document Type and Number:
Japanese Patent JP2023004091
Kind Code:
A
Abstract:
To provide a buried structure investigation device, an investigation image display control method, and an investigation image display control program that, even when a frequency of reciprocations of the buried structure investigation device along an object is reduced, can create an investigation image accurately indicating a position and a size of a buried structure.SOLUTION: A buried structure investigation device 10 is a device for detecting a buried structure 51 included in a wall surface 50, and comprises a capacitive sensor 13, an investigation image conversion processing unit 25, and a display 12. The capacitive sensor 13 detects presence or absence of the buried structure 51. In converting a detection result from the capacitive sensor 13 into an investigation image including the buried structure 51, the investigation image conversion processing unit 25 extends an image drawing range in a desired direction and converts the detection result into the investigation image. The display 12 displays the investigation image obtained through the conversion performed by the investigation image conversion processing unit 25.SELECTED DRAWING: Figure 3
Inventors:
FUJIO KOHEI
TSURUSU TETSURO
KAWAMOTO SHINGO
SAWAE RYUYA
TSURUSU TETSURO
KAWAMOTO SHINGO
SAWAE RYUYA
Application Number:
JP2021105589A
Publication Date:
January 17, 2023
Filing Date:
June 25, 2021
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO
International Classes:
G01V3/08
Attorney, Agent or Firm:
Masafumi Motoyama
Previous Patent: Environmental monitoring system and server
Next Patent: Sheet processing device and image forming system
Next Patent: Sheet processing device and image forming system