Title:
センサベースの測定のための校正係数
Document Type and Number:
Japanese Patent JP2012506554
Kind Code:
A
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Inventors:
Paul Edward Bickery
John Peter Beckley
John Peter Beckley
Application Number:
JP2011532724A
Publication Date:
March 15, 2012
Filing Date:
October 23, 2009
Export Citation:
Assignee:
TRANSENSE TECHNOLOGIES PLC
International Classes:
G01D18/00; B60C23/00; G01K7/32; G01L9/00; G01L27/00; G01M17/02
Attorney, Agent or Firm:
Axis International Patent Business Corporation