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Title:
CALIBRATION METHOD AND DEVICE FOR MONOLITHIC VOLTAGE REFERENCE
Document Type and Number:
Japanese Patent JP3167065
Kind Code:
B2
Abstract:

PURPOSE: To provide a method and a device to calibrate the monolithic voltage reference as a function of temperature.
CONSTITUTION: An error calibration device of the monolithic voltage reference has a bandgap voltage reference 50 which outputs the voltage that undergoes no trimming and the temperature voltage, and these voltage are sent to a delta- sigma type A/D converter 52. The output of the converter 52 is processed by a digital filter 54 and stored in an EEPROM 60. The EEPROM 60 stores the temperature history data in a certain mode and also stores the temperature compensation data in another mode. In a certain mode, a multiplier/accumulator 74 produces a compensation coefficient based on the temperature compensation parameter given from the EEPROM 60 and sends this coefficient to a D/A converter 76 which controls a trimming circuit 14 as a digital word. The circuit 14 compensates the temperature of output of the reference 50.


Inventors:
Bruce Del Signor
Eric Jay Swanson
Application Number:
JP23561293A
Publication Date:
May 14, 2001
Filing Date:
August 27, 1993
Export Citation:
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Assignee:
Crystal Semiconductor Corporation
International Classes:
G01R1/28; G01K7/01; G01K15/00; G05F3/30; G12B13/00; H03F1/30; H03M1/10; H03M1/12; G01R35/00; (IPC1-7): H03M1/10; G05F3/30
Domestic Patent References:
JP2241227A
JP3139873A
JP62114332A
JP5882130A
JP5616323A
JP6225317A
JP61149875U
Attorney, Agent or Firm:
Koichiro Kato (2 outside)