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Patent Searching and Data


Title:
CALIBRATION SYSTEM
Document Type and Number:
Japanese Patent JP2015219077
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To solve a conventional problem of the occurrence of irregularities due to the tendency of individual differences among devices since an error due to a secular change in a sensor device is corrected using a correction value statistically obtained from secular change data on physical properties and a calibration value is not calculated on the basis of an actual measurement value although the error may be corrected.SOLUTION: A calibration system uses a calibrator and a tool for correcting an error in a physical measurement value due to, for example, a secular change in a reference resistance value of a temperature measuring device, that is, calculates an error in the reference resistance value to provide a correction value on the basis of an actual measurement value output from the calibrator and make corrections of the measuring device, thereby making it possible to perform simple, accurate calibration per device.

Inventors:
SUZUKI TASUKU
IWAKI TAKASHI
KIHARA HAJIME
TAKAHASHI SHIGEYOSHI
YANAGIHARA NORIHISA
Application Number:
JP2014101912A
Publication Date:
December 07, 2015
Filing Date:
May 16, 2014
Export Citation:
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Assignee:
HITACHI INDUSTRIAL EQUIPMENT SYSTEMS CO LTD
International Classes:
G01K15/00; G01K7/18; G01K7/20
Domestic Patent References:
JPS60161538A1985-08-23
JPS60161538A1985-08-23
JP2007178180A2007-07-12
JP2005069929A2005-03-17
JPH06323609A1994-11-25
JP2012514756A2012-06-28
JP2007178180A2007-07-12
JP2005069929A2005-03-17
JPH06323609A1994-11-25
JP2012514756A2012-06-28
Foreign References:
US5469071A1995-11-21
US5469071A1995-11-21
Attorney, Agent or Firm:
井上 学
戸田 裕二
岩崎 重美