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Title:
ナノ結晶安全保障マーキングを用いた認証
Document Type and Number:
Japanese Patent JP2006528809
Kind Code:
A
Abstract:
Authentication systems, apparatus, and methods authenticate an identification marking including a nanocrystalline material. One or more properties of the marking are ascertained to provide a measured profile. The measured profile is compared to at least one member of a closed set of reference profiles. Each reference profile has predetermined values of one or more properties. Each reference profile is unique within the set. At least one reference profile is characteristic of an indicator material in a nanocrystalline morphology and non-characteristic of the same indicator material in a bulk morphology.

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Inventors:
Nelson David John
Jaganasan Seshadodri
Jaganasan Ramesh
Brunton Thomas Nelson
Sada Sivan Sliger
Sever Byron Ross
Tuschel David Daniel
Application Number:
JP2006521095A
Publication Date:
December 21, 2006
Filing Date:
July 06, 2004
Export Citation:
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Assignee:
Eastman Kodak Company
International Classes:
G06K19/06; G01N21/27; G01N23/04; G01N23/223; G01N23/225; G06K1/12; G06K7/12; G01N21/64
Attorney, Agent or Firm:
Kenji Yoshida
Jun Ishida