Title:
低エネルギーイオン照射による導電体物質からの特性X線発生方法とその装置
Document Type and Number:
Japanese Patent JP4735805
Kind Code:
B2
Inventors:
Akira Hasegawa
Kazuki Mitsuishi
Kazuo Furuya
Kazuki Mitsuishi
Kazuo Furuya
Application Number:
JP2005078278A
Publication Date:
July 27, 2011
Filing Date:
March 18, 2005
Export Citation:
Assignee:
National Institute for Materials Science
International Classes:
G01N23/225; G21K5/08; H01J35/00; H05G2/00
Domestic Patent References:
| JP62113052A | ||||
| JP8075684A | ||||
| JP9005263A | ||||
| JP6013012A | ||||
| JP6186178A | ||||
| JP2006046963A | ||||
| JP2006046964A | ||||
| JP2006046965A | ||||
| JP2006258671A |
Other References:
U.S.Fischer 他,“A channeling goniometer with a wide temperature range sample holder”,Nuclear Instruments and Methods in Physics Research B,1992年,Volume 68,pp.249-252