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Patent Searching and Data


Title:
CHARACTERISTIC FREQUENCY MEASURING SYSTEM
Document Type and Number:
Japanese Patent JP2006078273
Kind Code:
A
Abstract:

To provide a characteristic frequency measuring system capable of measuring the characteristic frequency of a building instantly and simply when the measurement is required.

This characteristic frequency measuring system 1 is constituted of an excitation means 2A(2) constituted of a plate 21 capable of reciprocating slide and stoppers 22, 22 provided on the end of a domain L capable of reciprocating slide, and a vibration detection means 4A(4) equipped with a plurality of such tense strings 41 between two supporting points that each string 41, etc., has a different characteristic frequency. A person N gets on the plate 21 and performs a reciprocating slide movement repeatedly in the X1 direction and in the Y1 direction alternately, to thereby generate horizontal forces F1, F2, and the building 8 is vibrated in the X2 direction and in the Y2 direction alternately, and a response vibration of the building 8 is measured by the vibration detection means 4A(4), to thereby determine the characteristic frequency of the building 8.


Inventors:
Nishimura, Shingo
Kadoya, Toru
Ota, Seiichi
Application Number:
JP2004000261337
Publication Date:
March 23, 2006
Filing Date:
September 08, 2004
Export Citation:
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Assignee:
SEKISUI CHEM CO LTD
International Classes:
G01M7/02; G01H1/00