Title:
CHARACTERISTIC INSPECTING DEVICE FOR ELECTRONIC PART
Document Type and Number:
Japanese Patent JP2003084024
Kind Code:
A
Abstract:
To provide a characteristic inspecting device for electronic parts, capable or relaxing impact force applied to the electronic parts.
This characteristic inspecting device for an electronic part p is formed by a measuring device 9 for measuring the characteristic of an electronic part p, a measurement terminal 11 electrically connected to the measuring device 9, a holding member 10 holding the measurement terminal 11, and a driving part 12 for abutting the measurement terminal 11 on the electronic part p. The measurement terminal 11 has a fitting part 11a held in the holding member 10, and a measuring part 11c abutting on the electronic part p. The driving part 12 is disposed away from the measurement terminal 11.
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Inventors:
INOUE TETSUKAZU
ISHII TOSHIHIRO
KONDO DAISUKE
ISHII TOSHIHIRO
KONDO DAISUKE
Application Number:
JP2002071786A
Publication Date:
March 19, 2003
Filing Date:
March 15, 2002
Export Citation:
Assignee:
MURATA MANUFACTURING CO
International Classes:
G01R31/26; G01R31/00; (IPC1-7): G01R31/00; G01R31/26
Attorney, Agent or Firm:
Tsutomu Shimoichi