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Title:
光散乱偏光測定を使用したガラス系試料の光学的リターダンスの特徴付け
Document Type and Number:
Japanese Patent JP7387751
Kind Code:
B2
Abstract:
Methods of characterizing an optical retardance or a stress-related property of a glass-bases sample include directing a light beam into the glass-based sample while varying the polarization of the light beam to generate scattered light for each polarization are provided. The scattered light for each polarization is captured with an image sensor, which has an exposure time and a frame rate. The scattered light has an intensity distribution at the image sensor. The sample is moved so that the image sensor averages two or more different intensity distributions per frame to form an averaged intensity distribution for each polarization. The averaged intensity distributions for multiple frames are then used to characterize the optical retardance. The optical retardance can turn be used to determine stress-related properties of the glass-based sample. Moving the substrate reduces measurement noise scattered light having no optical retardance information.

Inventors:
Furnas, William John
Application Number:
JP2021547656A
Publication Date:
November 28, 2023
Filing Date:
October 24, 2019
Export Citation:
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Assignee:
Corning Incorporated
International Classes:
G01L1/00; G01L1/24; G01N21/23
Domestic Patent References:
JP2005201749A
JP62182627A
JP2013015443A
Foreign References:
WO2018056121A1
US20160091416
US20030076487
DE10161914C1
Attorney, Agent or Firm:
Masafumi Yanagida
Hiroyuki Sakano
Hideaki Takahashi