To provide a charge density wave quantum phase microscope and a charge density wave quantum interferometer for actively utilizing macroscopic quantum phase information on a charge density wave.
This charge density wave quantum phase microscope is constructed by using a probe 12 made of a charge density wave crystal. A change in a threshold electric field of the wave crystal in bringing the probe 12 into contact with a specimen is measured by measuring the frequency of a narrow-band signal (NBS). Further, a needle crystal consisting of the wave crystal is used to structure this charge density wave quantum interferometer. A change in a threshold electric field of the wave crystal in impressing a gate voltage on a side surface of the needle crystal is measured by measuring the frequency of the narrow-band signal.
INAGAKI KATSUHIKO
OKAWA HIROYUKI
NISHIDA MUNEHIRO
