Title:
INSPECTION GUIDE SYSTEM
Document Type and Number:
Japanese Patent JP2017081685
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide an inspection guide system which can improve work efficiency of inspection work of an object facility.SOLUTION: An inspection guide system 100 guides on inspection at an inspection terminal 2, and includes: an inspection specifying information DB 142 which stores inspection item information for specifying an inspection item to be inspected, and installation place information for specifying an installation place of an object facility as an inspection object of the inspection item which the inspection item information specifies by corresponding to each other; a map information DB 141 which stores map information for specifying a map including the place the object facility is installed; a current position detection part 25 which detects a position of the inspection terminal 2; and a terminal side guide part 271 which displays an inspection guide screen and inspection item detail information on a display 23 of the inspection terminal 2.SELECTED DRAWING: Figure 1
Inventors:
KATO YASUYUKI
Application Number:
JP2015211142A
Publication Date:
May 18, 2017
Filing Date:
October 27, 2015
Export Citation:
Assignee:
CYBER LABORATORY INC
International Classes:
B66B5/00
Domestic Patent References:
| JP2001118177A | 2001-04-27 | |||
| JPH10116113A | 1998-05-06 | |||
| JP2002189513A | 2002-07-05 | |||
| JPH0962340A | 1997-03-07 | |||
| JPH0213812A | 1990-01-18 | |||
| JP2013205846A | 2013-10-07 | |||
| JP2000029934A | 2000-01-28 |
Attorney, Agent or Firm:
Tatsuya Saito
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