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Title:
CHEMICAL AMPLIFICATION TYPE POSITIVE RESIST MATERIAL
Document Type and Number:
Japanese Patent JP3198845
Kind Code:
B2
Abstract:

PURPOSE: To provide a chemical amplification type positive resist material having high sensitivity against high-energy beams such as far ultraviolet rays, electron beams, and X-rays, particularly KrF excimer laser, capable of forming a pattern when developed by an alkaline aqueous solution, excellent in sensitivity, resolution, and plasma etching resistance, and having a resist pattern excellent in heat resistance.
CONSTITUTION: The new sulfonium salt expressed by the formula is contained, where R1 indicates the hydrogen atom, alkyl group, or alkoxy group, Y indicates trifluoromethane sulfonate or p-toluene sulfonate, (n) is an integer of 0-2, (m) is an integer of 1-3, and n+m=3.


Inventors:
Youichi Ohsawa
Satoshi Watanabe
Katsuyuki Oikawa
Hironobu Tanaka
Yoshio Kawai
Jiro Nakamura
Application Number:
JP32991494A
Publication Date:
August 13, 2001
Filing Date:
December 05, 1994
Export Citation:
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Assignee:
Shin-Etsu Chemical Co., Ltd.
Nippon Telegraph and Telephone Corporation
International Classes:
C07C381/12; G03F7/004; H01L21/027; (IPC1-7): G03F7/004; H01L21/027
Domestic Patent References:
JP3189652A
JP4258959A
JP4248554A
JP6194840A
JP6242607A
JP2181151A
JP2181150A
JP4219757A
JP643653A
JP5323590A
JP6236033A
JP6287174A
JP8157451A
Attorney, Agent or Firm:
Takashi Kojima