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Title:
CHEMICALLY AMPLIFIABLE RESIST AND RESIST PATTERN FORMING METHOD
Document Type and Number:
Japanese Patent JPH05241344
Kind Code:
A
Abstract:

PURPOSE: To form a resist pattern excellent in resolution.

CONSTITUTION: A copolymer having P-O-Si bonds in the principal chain and at least alkyl or aryl groups in the side chain is used as base resin and a chemically amplifiable resist is prepd. with the base resin and an acid generating agent. This resist is used as the upper resist of a two-layered resist, an upper pattern is formed by selective exposure and development and the lower resist is dry-etched with oxygen plasma through the upper pattern as a mask to form a resist pattern.


Inventors:
YANO EI
FUKUYAMA SHUNICHI
WATABE KEIJI
NAMIKI TAKAHISA
FUKUDA MANAMI
Application Number:
JP4508092A
Publication Date:
September 21, 1993
Filing Date:
March 03, 1992
Export Citation:
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Assignee:
FUJITSU LTD
International Classes:
G03F7/029; G03F7/039; G03F7/075; G03F7/26; H01L21/027; (IPC1-7): G03F7/075; G03F7/029; G03F7/039; G03F7/26; H01L21/027
Attorney, Agent or Firm:
Teiichi



 
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