Title:
CIRCUIT INSPECTING METHOD AND CIRCUIT BOARD CORRESPONDING TO THIS INSPECTING METHOD
Document Type and Number:
Japanese Patent JP2000275274
Kind Code:
A
Abstract:
To make a circuit inspection regardless of the outer shape precision of a circuit board and the position precision of a circuit.
In this inspecting method, magnetic attracting force is applied between a rockably held probe 1 and a circuit 55 to bring the probe 1 into contact with the circuit 55 when bringing the probe 1 into contact with the circuit 55 on a substrate 5 for inspecting the circuit 55. Even if the probe 1 and the circuit 55 are somewhat deviated in position, the probe 1 is rocked into contact with the circuit 55 by the magnetic attracting force, and the probe 1 is made rockable at the tip only.
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Inventors:
YAMANAKA HIROSHI
MATSUMURA KAZUNORI
KIMURA KENICHI
NAKATANI TAKUYA
MATSUMURA KAZUNORI
KIMURA KENICHI
NAKATANI TAKUYA
Application Number:
JP8273499A
Publication Date:
October 06, 2000
Filing Date:
March 26, 1999
Export Citation:
Assignee:
MATSUSHITA ELECTRIC WORKS LTD
International Classes:
H05K3/00; G01R1/06; G01R1/067; G01R31/02; G01R31/28; (IPC1-7): G01R1/067; G01R1/06; G01R31/02; G01R31/28; H05K3/00
Domestic Patent References:
| JPH09237962A | 1997-09-09 | |||
| JPH0457767U | 1992-05-18 |
Attorney, Agent or Firm:
Keisei Nishikawa (1 person outside)