PURPOSE: To reduce damage to an element to be tested and elements on the upstream thereof while improving the testing speed by enabling a proper selection of the waiting time between tests in a circuit testing.
CONSTITUTION: A topology analysis section 94 classifies the family patterns to select a test pattern suitable for testing an element therefrom and transmits it to a damage analysis section 95 together with a topology data and protection data. The damage analysis section 95 calculates the time interval necessary for testing to determine whether the test can damage elements on the upstream and calculates the variable waiting time necessary between tests. The data thus obtained is transmitted to a test control section 96 together with a protection parameter and then, the test control section 96 inserts the variable waiting time between tests so as not to damage the element on the upstream. This can reduce damage to the element being tested and any element on the upstream while improving the testing speed.
BANSU RATSUSERU HAAUTSUDO
TOOMASU AARU FUEI
ERUTON KAATEISU BINGAMU
MIKAERU ANSONII TESUKA
