Title:
クリアランス計測装置、クリアランス計測センサ及びクリアランス計測方法
Document Type and Number:
Japanese Patent JP6959027
Kind Code:
B2
Abstract:
A clearance measurement device is a device for measuring a clearance between an inner peripheral surface of a casing and an outer peripheral surface of a rotary body. This device: emits light having a first wavelength and a second wavelength, respectively, towards the outer peripheral surface of the rotary body; receives the light reflected from the outer peripheral surface via a first filter having a transmission band corresponding to the first wavelength and via a second filter having a transmission band corresponding to the second wavelength; and measures the clearance based on a time difference of the moment to detect the rotary body.
Inventors:
Fukuyama Misaki
Akio Kondo
Tomoyuki Onishi
Takahiro Miyamoto
Akio Kondo
Tomoyuki Onishi
Takahiro Miyamoto
Application Number:
JP2017086222A
Publication Date:
November 02, 2021
Filing Date:
April 25, 2017
Export Citation:
Assignee:
MITSUBISHI HEAVY INDUSTRIES,LTD.
International Classes:
G01B11/14; F01D25/00; F02C7/00
Domestic Patent References:
| JP59142408A | ||||
| JP2009168602A | ||||
| JP2016017921A | ||||
| JP4030105A |
Foreign References:
| US4766323 | ||||
| WO2016069278A1 |
Attorney, Agent or Firm:
Seishin ip patent business corporation
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