Title:
ＲＦ試験環境の閉ループ制御
Document Type and Number:
Japanese Patent JP7382501
Kind Code:
B2
Abstract:
Embodiments of a controller device and methods of control for a radio frequency (RF) test environment are generally described herein. The RF test environment may include the controller device, an RF generator, and a device under test (DUT). The DUT may be configurable to switch between multiple configurations. The controller device may receive feedback from the DUT that indicates a current configuration of the DUT. The controller device may use a machine learning rule to determine a set of candidate future configurations of the DUT based on the current configuration of the DUT. The controller device may generate a set of RF waveforms corresponding to the set of candidate future configurations of the DUT, and may transfer the set of RF waveforms to the RF generator.
Inventors:
Bayhee, Scott W.
Russell, Aubrey Jay.
Russell, Aubrey Jay.
Application Number:
JP2022523438A
Publication Date:
November 16, 2023
Filing Date:
August 17, 2020
Export Citation:
Assignee:
Raytheon Company
International Classes:
H04B17/29
Domestic Patent References:
| JP2015504290A | ||||
| JP2016517206A | ||||
| JP2018059912A | ||||
| JP2016158209A |
Foreign References:
| GB2546438A | ||||
| CN107835057A |
Attorney, Agent or Firm:
Tadashige Ito
Tadahiko Ito
Osamu Miyazaki
Tadahiko Ito
Osamu Miyazaki
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