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Patent Searching and Data


Title:
CMP CONDITIONER AND MANUFACTURING METHOD THEREFOR
Document Type and Number:
Japanese Patent JP2008114334
Kind Code:
A
Abstract:

To provide a CMP conditioner capable of preventing a metallic element from eluding into slurry.

A number of tapered holes 14 are formed in a sheet 12 made of ceramic, corrosion-resistant resin, rolled material, or the like to accommodate diamond grains 16. The sheet 12 and the diamond grains 16 are stuck by adhesive 26 to be fixed in a state in which a part of each diamond grain 16 is protruded from an opening of the tapered hole 14. The diamond grains 16 are mechanically positioned in a number of the tapered holes 14 of the sheet 12, and, it is possible to prevent falling-off, and to use adhesive which does not include metal. Therefore, it is also possible to prevent scratches from occurring on a polished surface of a semiconductor wafer or the like polished by the CMP device. Moreover, it is possible to perform conditioning of a polishing pad for forming a high quality device in a stable state for a long period.


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Inventors:
YAMASHITA TETSUJI
Application Number:
JP2006300099A
Publication Date:
May 22, 2008
Filing Date:
November 06, 2006
Export Citation:
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Assignee:
MEZOTEKU DIA KK
International Classes:
B24B53/12; B24D3/00; B24D3/22; H01L21/304
Attorney, Agent or Firm:
Yuji Kato