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Patent Searching and Data


Title:
CMP-POLISHING AGENT AND METHOD FOR POLISHING SUBSTRATE
Document Type and Number:
Japanese Patent JP2001007061
Kind Code:
A
Abstract:

To polish a surface without flaws at a high speed for making high planarity by comprising a low-molecular additive selected from among cerium oxide particle, dispersant, and cationic water-soluble organic low-molecule, in short a specified amine or ammonium, as well as water.

A low-molecular additive, as well as water, selected from among cerium oxide particles, dispersant, and cationic water-soluble organic low- molecule which is a first class amine, second class amine, third class amine or fourth class ammonium, are included in this polishing agent. So, under a high polishing load, a cerium oxide particle breaks through the coat of additive formed on a surface to be polished to increase a polishing speed. If roughness exists on the surface to be polished, since effective polishing load at a protruding part is larger than a recessed part, the protruding part is selectively polished to accomplish making global planarity with less dependency on a pattern.


Inventors:
KOYAMA NAOYUKI
MACHII YOICHI
YOSHIDA MASATO
ASHIZAWA TORANOSUKE
Application Number:
JP17281999A
Publication Date:
January 12, 2001
Filing Date:
June 18, 1999
Export Citation:
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Assignee:
HITACHI CHEMICAL CO LTD
International Classes:
B24B37/00; C09K3/14; C09K13/00; H01L21/304; (IPC1-7): H01L21/304; B24B37/00; C09K3/14; C09K13/00; H01L21/304
Attorney, Agent or Firm:
Kunihiko Wakabayashi