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Patent Searching and Data


Title:
COLOR ABERRATION DOUBLE FOCUS DEVICE
Document Type and Number:
Japanese Patent JPH04336415
Kind Code:
A
Abstract:

PURPOSE: To lighten the manufacturing cost of a pattern barrier filter by using a filter for illumination having the function of the pattern barrier filter, using the filter for illumination which takes out only lights of two wavelengths of an illumination system.

CONSTITUTION: An illumination system makes an illumination light of wavelength α and an illumination light of wavelength β from the luminous fluxes emitted out of two light source 1 and 2 through a filter 3 for illumination and a filter 4 for illumination. The luminous fluxes of wavelengths α and β are put together with a dichroic mirror 5 through collimator lenses 18 and 19, and it is let fall to irradiate an X-ray mask face 8 and a wafer face 9, respectively, through a half mirror 6 and an objective 7. The images of a mask mark 14 and wafer mask 15 are formed in the same position by an color aberration objective 7 on the axis. These image are picked up with a CCD camera 13 through a pattern barrier filter 12. Thereby, the manufacturing cost of the pattern barrier filter an be lightened.


Inventors:
MIYATAKE TSUTOMU
Application Number:
JP13533591A
Publication Date:
November 24, 1992
Filing Date:
May 13, 1991
Export Citation:
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Assignee:
SUMITOMO HEAVY INDUSTRIES
International Classes:
G03F7/20; G03F9/00; H01L21/027; H01L21/30; (IPC1-7): G03F9/00; H01L21/027