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Patent Searching and Data


Title:
DUTの故障に起因するテスト信号の劣化の補償
Document Type and Number:
Japanese Patent JP2005533251
Kind Code:
A
Abstract:
An electronic device tester channel transmits a single test signal to multiple terminals of electronic devices under test (DUTs) through a set of isolation resistors. The tester channel employs feedback to automatically adjust the test signal voltage to compensate for affects of faults at any of the DUT terminals to prevent the faults from substantially affecting the test signal voltage.

Inventors:
Mirror, charles, ray
Application Number:
JP2004521659A
Publication Date:
November 04, 2005
Filing Date:
July 09, 2003
Export Citation:
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Assignee:
Form Factor, Incorporated
International Classes:
G01R31/28; G01R31/00; G01R31/26; G01R31/317; G01R31/319; (IPC1-7): G01R31/28
Attorney, Agent or Firm:
Satoshi Furuya
Takahiko Mizobe
Kiyoharu Nishiyama